2021
DOI: 10.1016/j.cie.2020.107015
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Anomaly detection of power consumption in yarn spinning using transfer learning

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Cited by 25 publications
(13 citation statements)
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“…A CDAN model was suggested in Xu et al's (2021) [5] research to optimize the effectiveness of transfer learning for spinning power usage anomaly detection. Between the element that links the source and target networks, a clusterbased adaption layer was introduced.…”
Section: Literature Reviewmentioning
confidence: 99%
“…A CDAN model was suggested in Xu et al's (2021) [5] research to optimize the effectiveness of transfer learning for spinning power usage anomaly detection. Between the element that links the source and target networks, a clusterbased adaption layer was introduced.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Another remarkable approach is the one presented by Jindal et al (2020) In other reported cases, the authors work with manually labelled training data (i.e., the so-called supervised anomaly detection), although this is not the most common situation in a real environment. An exemplifying recent article of this kind is Xu et al (2021), where data belong to a newlybuilt spinning workshop for which there is insufficient historical data to detect power consumption anomalies. The authors use transfer learning to compensate for the lack of data, and hence for the potential unrepresentativeness of the knowledge captured by the developed data-based models.…”
Section: Anomaly Detection In Manufacturing Cppsmentioning
confidence: 99%
“…However, over time this trend is reversed. In B. Zhao, Qin, Gao, and Xu et al (2021) the authors design an energy saving diagnosis process in a petrochemical plant based on the dual Curvelet support vector machine (SVM). To improve the accuracy and optimize the hyper parameters of the SVM, they construct a hybrid glowworm swarm optimisation algorithm based on simulated annealing to optimize the parameters of the twin Curvelet SVM.…”
Section: Related Work and Contributionmentioning
confidence: 99%
“…The transfer learning, as an emerging learning paradigm, has become a hot research topic because it can transfer the knowledge learned from similar data to improve the model precision of a new target [28]. Such transfer can transmit the knowledge learned from sufficient data to a new environment in case of data deficiency [29], which is conducive to constructing the high-precision model under different environments. To achieve the prediction of wafer CT at different WIP levels, a transfer learning network based on hierarchical optimization was proposed in this paper.…”
Section: Related Workmentioning
confidence: 99%