Anomalous kinetic roughening in growth of MoS₂ films under pulsed laser deposition

Abstract

MoS2 films grown on glass by pulsed laser deposition technique evolve from bilayer to bulk-like structure with time following intrinsic anomalous scaling behaviour caused by shadowing effect during deposition.

Investigation of Surface Scaling, Optical and Microwave Dielectric Studies of Bi0.5Na0.5TiO3 thin Films

“…The surface morphology of BNT thin films was investigated by AFM which gives an insight of surface microstructure, scaling behavior, and growth dynamics of the films. The equation [31,38].…”

“…The In order to understand the dynamic scaling behavior and growth mechanism of films, the height-height correlation function (HHCF) is fitted with a suitable theoretical model to estimate the growth parameters: local roughness (αloc), RMS roughness (interface width) () and lateral correlation length () are calculated from AFM images using HHCF), H(r, t), which can describe the type of scaling and growth mechanism. It is a statistical average of the mean square of height difference between pair points (x, y) and (x′, y′), separated by a distance r is given by following equation [31,38].…”

Investigation of surface scaling, optical and microwave dielectric studies of Bi0.5Na0.5TiO3 thin films

“…In order to understand the dynamic scaling behavior and growth mechanism of films, the height-height correlation function (HHCF) is fitted with a suitable theoretical model to estimate the growth parameters: local roughness (αloc), RMS roughness (interface width) () and lateral correlation length () are calculated from AFM images using HHCF), H(r, t), which can describe the type of scaling and growth mechanism. It is a statistical average of the mean square of height difference between pair points (x, y) and (x′, y′), separated by a distance r is given by following equation [31,38].…”

“…The scaling theory is used to understand the growth dynamics to evaluate the statistical properties from surface morphology of films. In the past years, many theoretical models were established to study the growth mechanism of films to a set of scaling exponents [29][30][31]. However, there are no reports available on the growth mechanism of PLD deposited BNT films using scaling theory and is motivated to pursue this study.…”

Roughness and Correlations in the Transition from Island to Film Growth: Simulations and Application to CdTe Deposition

“…This approach helps to infer the main physical pro-cesses that control the growth and was already applied to deposits of various materials [15][16][17]. Several works have also investigated the scaling of surface fluctuations and correlations in the initial stages of heteroepitaxial film deposition [18][19][20][21][22][23][24][25][26][27][28][29][30][31]. Their results cannot be interpreted in the light of kinetic roughening theories because the deposits are mostly formed by isolated islands, so that height fluctuations and correlations are related to island widths, heights, and surface density.…”