2007
DOI: 10.1021/jp062337e
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Anomalous Diffusion in Poly(vinyl alcohol)−Poly(acrylic acid) Thin Films

Abstract: Dynamic in situ spectroscopic ellipsometry studies of poly(vinyl alcohol)−poly(acrylic acid) (PVA−PAA) composite films are presented. Thin films immobilized on glass substrates were conditioned over time in aqueous media. Dynamic measurements consisted of thickness (swelling ratio) and optical constant changes in time. The films displayed anomalous diffusion that was characterized by fast initial swelling followed by a much slower thickness reduction. A simple mechanism based on polymer network relaxation was … Show more

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Cited by 12 publications
(13 citation statements)
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“…The positions of the Gaussian oscillators were also fixed, but their width and amplitude terms were variables in the fit. The oscillators were fitted to the experimental spectrum acquired for the film equilibrated in R6G + solution under the conditions of a static spectroscopic ellipsometric scan 21,22 to determine the film extinction coefficient, k(λ). It was found that only one combination of the monomer extinction and dimer oscillator functions was able to adequately reproduce the experimental extinction spectrum.…”
Section: Resultsmentioning
confidence: 99%
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“…The positions of the Gaussian oscillators were also fixed, but their width and amplitude terms were variables in the fit. The oscillators were fitted to the experimental spectrum acquired for the film equilibrated in R6G + solution under the conditions of a static spectroscopic ellipsometric scan 21,22 to determine the film extinction coefficient, k(λ). It was found that only one combination of the monomer extinction and dimer oscillator functions was able to adequately reproduce the experimental extinction spectrum.…”
Section: Resultsmentioning
confidence: 99%
“…Concurrent Spectroscopic Ellipsometry and Quartz Crystal Microgravimetry. A method for modeling mass transport in thin polymer films has been previously described. , It is based on the assumption that the proportionality between ellipsometry determined film thickness and film mass has the form …”
Section: Resultsmentioning
confidence: 99%
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