2020
DOI: 10.1080/01411594.2020.1837379
|View full text |Cite
|
Sign up to set email alerts
|

Annealing temperature investigation on electrodeposited Cu2O properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

2
0
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(2 citation statements)
references
References 43 publications
2
0
0
Order By: Relevance
“…00-044-0706. 39 Previously, similar results were reported by Guzman et al 40 and Ganga et al 41 These XRD patterns do not show any impurity peak. Because of the nanosize effect, peaks are broad and wide.…”
Section: Resultssupporting
confidence: 85%
See 1 more Smart Citation
“…00-044-0706. 39 Previously, similar results were reported by Guzman et al 40 and Ganga et al 41 These XRD patterns do not show any impurity peak. Because of the nanosize effect, peaks are broad and wide.…”
Section: Resultssupporting
confidence: 85%
“…The structure’s lattice parameters are a = 4.84 Å, b = 3.47 Å, and c = 5.33 Å, which agree well with the standard JCPDS card no. 00-044-0706 . Previously, similar results were reported by Guzman et al and Ganga et al These XRD patterns do not show any impurity peak.…”
Section: Resultssupporting
confidence: 82%