Annealing Assisted Structural Modifications in CdS Thin Films

Abstract

The present article deals with synthesis of CdS thin films using cost effective chemical bath deposition method and study effect of annealing over the structural properties using X-ray diffraction pattern (XRD). The XRD pattern revealed shift in peak position and variation in intensity upon annealing at different temperatures; this may be attributed to annealing assisted modifications in composition of the thin films. The as deposited CdS thin films represents peaks corresponding to (002), (101), (111) and (110) which in case of annealed samples at 200 and 400oC get modified and slightly shifted with rising some new peaks corresponding to (200) and (001) respectively. The crystallite size of the CdS thin films upon annealing is observed to be increased this may be co-related to the fact energy induced grain growth.