2021
DOI: 10.1016/j.ijheatmasstransfer.2020.120600
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Anisotropic thermal conductivity tensor measurements using beam-offset frequency domain thermoreflectance (BO-FDTR) for materials lacking in-plane symmetry

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Cited by 19 publications
(9 citation statements)
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“…TDTR has been used to study a variety of ion irradiated materials including nuclear fuel [570], nuclear fuel cladding [571], silicon carbide [572] metallic multi-layers [571], silicon [571,573], sapphire [574], and diamond [575] across orders of magnitude in thermal conductivity. MTR, also referred to as spatial domain or beam-offset thermoreflectance [576,577,578,579,580,581], has been used in the majority of studies of ion irradiated actinide oxides and their surrogates. MTR utilizes modulated continuous wave (CW) lasers to inject thermal waves into a sample under investigation.…”
Section: Experimental Measurement Of Thermal Conductivitymentioning
confidence: 99%
“…TDTR has been used to study a variety of ion irradiated materials including nuclear fuel [570], nuclear fuel cladding [571], silicon carbide [572] metallic multi-layers [571], silicon [571,573], sapphire [574], and diamond [575] across orders of magnitude in thermal conductivity. MTR, also referred to as spatial domain or beam-offset thermoreflectance [576,577,578,579,580,581], has been used in the majority of studies of ion irradiated actinide oxides and their surrogates. MTR utilizes modulated continuous wave (CW) lasers to inject thermal waves into a sample under investigation.…”
Section: Experimental Measurement Of Thermal Conductivitymentioning
confidence: 99%
“…The development of novel experimental methodologies to study anisotropic thermal transport has recently become a relevant research objective. A considerable number of experimental techniques and methodologies 9,[14][15][16][17][18][19][20][21][22][23][24][25][26][27] based on variations of the 3-omega method, 28 time-domain thermoreflectance, 29 and frequency-domain thermoreflectance 30 have been developed for this purpose, demonstrating their capability to obtain the components of κ i j . The main differences between these approaches are the dimensionality of the heat source (line or spot), and their contact or contactless fashion (electrical resistor or focused optical spot).…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, contactless techniques such as those reported in Refs. [9,[17][18][19][20][21][22][23][24][25][26][27] are based on small Gaussian or ellipse-shaped focused spots, i.e., sensitive to all crystallographic directions simultaneously. Although this is not an intrinsic impediment to obtain κ i j , it substantially complicates the analysis of the measured data with respect to the case of an elongated line-shaped heat source (sensitive to only two cyrstallographic directions simulataneously), as it is evident from Refs.…”
Section: Introductionmentioning
confidence: 99%
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