GaN quantum dots grown in (112true̅2)’orientated AlN are studied. The false(11true22‾false)‐nucleated quantum dots exhibit rectangular‐ or trapezoid‐based truncated pyramidal morphology. Another quantum dot type orientated on false(10true11‾false) is reported. Based on high‐resolution transmission microscopy and crystal symmetry, the geometry of false(10true11‾false)‐orientated quantum dots is proposed. A piezoelectric model is used within a finite element method to determine and compare the strain‐state and electrostatic potential associated with the quantum dot morphology and an estimation of the band‐edge energy is made. We report on some novel properties of the false(10true11‾false)‐orientated quantum dot, including mixed strain‐states and strain‐state bowing.