Abstract:Using first-principles electronic structure calculations we identify the anion vacancies in II-VI and chalcopyrite Cu-III-VI 2 semiconductors as a class of intrinsic defects that can exhibit metastable behavior. Specifically, we predict persistent electron photoconductivity (n-type PPC) caused by the oxygen vacancy V O in n-ZnO, and persistent hole photoconductivity (p-type PPC) caused by the Se vacancy V Se in p-CuInSe 2 and p-CuGaSe 2 . We find that V Se in the chalcopyrite materials is amphoteric having two… Show more
“…If the ionization energies of these defects are low, the system will tend to be an intrinsic n-type conductor. Some early studies have indicated that vacancies are shallow donors in these oxides [29][30][31][32][33][34][35][36][37][38], but more recent analysis based on plane-wave density functional theory (DFT), first using a Hubbard U parameter then, in later studies, a hybrid functional, tends to place them as deep centers in many TCOs [20,[39][40][41][42][43][44][45][46][47][48][49][50][51][52][53][54][55]. Of those that have been shown to form shallow centers [41,[56][57][58][59], it has been argued that their compact wave functions preclude the possibility of them contributing to n-type conductivity [59][60][61].…”
The source of n-type conductivity in undoped transparent conducting oxides has been a topic of debate for several decades. The point defect of most interest in this respect is the oxygen vacancy, but there are many conflicting reports on the shallow versus deep nature of its related electronic states. Here, using a hybrid quantum mechanical/molecular mechanical embedded cluster approach, we have computed formation and ionization energies of oxygen vacancies in three representative transparent conducting oxides: In 2 O 3 , SnO 2 , and ZnO. We find that, in all three systems, oxygen vacancies form well-localized, compact donors. We demonstrate, however, that such compactness does not preclude the possibility of these states being shallow in nature, by considering the energetic balance between the vacancy binding electrons that are in localized orbitals or in effective-mass-like diffuse orbitals. Our results show that, thermodynamically, oxygen vacancies in bulk In 2 O 3 introduce states above the conduction band minimum that contribute significantly to the observed conductivity properties of undoped samples. For ZnO and SnO 2 , the states are deep, and our calculated ionization energies agree well with thermochemical and optical experiments. Our computed equilibrium defect and carrier concentrations, however, demonstrate that these deep states may nevertheless lead to significant intrinsic n-type conductivity under reducing conditions at elevated temperatures. Our study indicates the importance of oxygen vacancies in relation to intrinsic carrier concentrations not only in In 2 O 3 , but also in SnO 2 and ZnO.
“…If the ionization energies of these defects are low, the system will tend to be an intrinsic n-type conductor. Some early studies have indicated that vacancies are shallow donors in these oxides [29][30][31][32][33][34][35][36][37][38], but more recent analysis based on plane-wave density functional theory (DFT), first using a Hubbard U parameter then, in later studies, a hybrid functional, tends to place them as deep centers in many TCOs [20,[39][40][41][42][43][44][45][46][47][48][49][50][51][52][53][54][55]. Of those that have been shown to form shallow centers [41,[56][57][58][59], it has been argued that their compact wave functions preclude the possibility of them contributing to n-type conductivity [59][60][61].…”
The source of n-type conductivity in undoped transparent conducting oxides has been a topic of debate for several decades. The point defect of most interest in this respect is the oxygen vacancy, but there are many conflicting reports on the shallow versus deep nature of its related electronic states. Here, using a hybrid quantum mechanical/molecular mechanical embedded cluster approach, we have computed formation and ionization energies of oxygen vacancies in three representative transparent conducting oxides: In 2 O 3 , SnO 2 , and ZnO. We find that, in all three systems, oxygen vacancies form well-localized, compact donors. We demonstrate, however, that such compactness does not preclude the possibility of these states being shallow in nature, by considering the energetic balance between the vacancy binding electrons that are in localized orbitals or in effective-mass-like diffuse orbitals. Our results show that, thermodynamically, oxygen vacancies in bulk In 2 O 3 introduce states above the conduction band minimum that contribute significantly to the observed conductivity properties of undoped samples. For ZnO and SnO 2 , the states are deep, and our calculated ionization energies agree well with thermochemical and optical experiments. Our computed equilibrium defect and carrier concentrations, however, demonstrate that these deep states may nevertheless lead to significant intrinsic n-type conductivity under reducing conditions at elevated temperatures. Our study indicates the importance of oxygen vacancies in relation to intrinsic carrier concentrations not only in In 2 O 3 , but also in SnO 2 and ZnO.
“…Earlier work mainly used local density approximation (LDA) or LDA+U (Ref. 2) Hamiltonians. These methods underestimate the band gaps of wide gap oxides 2 and so corrections to the band gap are necessary when calculating TL.…”
Section: Introductionmentioning
confidence: 99%
“…2) Hamiltonians. These methods underestimate the band gaps of wide gap oxides 2 and so corrections to the band gap are necessary when calculating TL. Here, we use the B3LYP hybrid density functional 9, 10 which predicts a single particle band gap for ZnO (3.17 eV, this work) in good agreement with experiment (3.47 eV (Ref.…”
Transition levels of defects are commonly calculated using either methods based on total energies of defects in relevant charge states or energy band single particle eigenvalues. The former method requires calculation of total energies of charged, perfect bulk supercells, as well as charged defect supercells, to obtain defect formation energies for various charge states. The latter method depends on Janak's theorem to obtain differences in defect formation energies for various charge states. Transition levels of V Zn , V O , and V ZnO vacancy defects in ZnO are calculated using both methods. The mean absolute deviation in transition level calculated using either method is 0.3 eV. Relative computational costs and accuracies of the methods are discussed.
“…2 A second mechanism involves photoexcitation of an electron ͑or multiple electrons͒ from a deep donor into the conduction band, followed by a reconfiguration of the lattice that moves the ionized state of the deep donor well into the conduction band, say, to an energy E C + ⌬E. Lany and Zunger 18 have proposed such a mechanism for the oxygen vacancy V O , which in thermal equilibrium is deep ͑roughly E C −2 eV͒ and neutral. Their theoretical calculations find that if the two valence electrons of V O are excited ͑in separate steps͒ to the conduction band ͑while the trap-filling light is on͒ the resultant state V O ++ +2e − is pushed by the lattice reconfiguration into the conduction band to about E C + 0.2 eV.…”
Thermally stimulated current ͑TSC͒ spectroscopy and temperature-dependent dark current ͑DC͒ measurements have been applied to study traps and photoinduced persistent surface conduction in two hydrothermally grown bulk ZnO samples, as-grown, and annealed at 600°C in N 2 ambient for 30 min, respectively. The as-grown sample had a room-temperature ͑RT͒ resistivity of 1.6 ϫ 10 3 ⍀ cm, mobility of 2.1ϫ 10 2 cm 2 / V s, and carrier concentration of 1.8ϫ 10 13 cm −3 , while the annealed sample was highly resistive, with RT resistivity of 3.6ϫ 10 6 ⍀ cm, mobility of 4.4 cm 2 / V s, and carrier concentration of 3.9ϫ 10 11 cm −3 . The as-grown sample showed strong conduction at low temperatures, which has been shown to be due to near-surface carriers in other studies. The annealed sample did not demonstrate this phenomenon. The dominant trap in the as-grown sample had an activation energy of 0.16 eV, was strongest near the surface, and is possibly related to V Zn . In the annealed sample, however, the dominant trap had an activation energy of 0.22 eV, was of bulk nature, and is tentatively assigned to Li Zn . After several routine TSC measurements, the DC for the as-grown sample increased by more than one order of magnitude at low temperatures ͑T Ͻ 180 K͒, while for the annealed sample, the DC increased by a factor of 2 at high temperatures ͑T Ͼ 200 K͒. These effects are generated by the TSC trap-filling illumination and can persist for many days under vacuum. At RT, the DC in the annealed sample returns to its equilibrium state if the sample is vented to air.
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