Compound-specific
isotope analysis of sulfur (δ34S-CSIA) in organic
compounds was established in the last decade employing
gas chromatography connected to multiple-collector inductively coupled
plasma mass spectrometry (GC-MC-ICPMS). However, δ33S-CSIA has not yet been reported so far. In this study, we present
a method for the simultaneous determination of δ33S and δ34S in organic compounds by GC-MC-ICPMS applying
medium- and also low-mass-resolution modes. The method was validated
using the international isotope reference materials IAEA-S-1, IAEA-S-2,
and IAEA-S-3. Overall analytical uncertainty including normalization
and reproducibility for δ33S and δ34S was usually better than ±0.2 mUr (σ) for analytes containing
at least 100 pmol of S. Further, it is demonstrated that, despite
small isobaric interferences, results obtained at low mass resolution
are indistinguishable from medium mass resolution offering the benefit
of increased sensitivity and versatility of this method. Additionally,
the method was applied for the δ33S and δ34S isotope analysis of industrially produced organic compounds
to investigate potential mass-independent fractionation (MIF). The
relation between δ34S and δ33S in
these compounds followed a mass-dependent fractionation trend (MDF;
Δ33S ≤ ±0.2 mUr). Degradation of dimethyl
disulfide by direct photolysis caused a small but significant MIF
(Δ33S = 0.55 ± 0.04 mUr, n =
3), demonstrating sufficient sensitivity of the method for these types
of studies.