Magnetic force microscopy (MFM) has been demonstrated as valuable technique for the
characterization of magnetic nanomaterials. To be analyzed by MFM techniques,
nanomaterials are generally deposited on flat substrates, resulting in an additional
contrast in MFM images due to unavoidable heterogeneous electrostatic tip-sample
interactions, which cannot be easily distinguished from the magnetic one. In order
to correctly interpret MFM data, a method to remove the electrostatic contributions
from MFM images is needed. In this work, we propose a new MFM technique, called
controlled magnetization MFM (CM-MFM), based on the in situ control of the
probe magnetization state, which allows the evaluation and the elimination of
electrostatic contribution in MFM images. The effectiveness of the technique is
demonstrated through a challenging case study, i.e., the analysis of
superparamagnetic nanoparticles in absence of applied external magnetic field. Our
CM-MFM technique allowed us to acquire magnetic images depurated of the
electrostatic contributions, which revealed that the magnetic field generated by the
tip is sufficient to completely orient the superparamagnetic nanoparticles and that
the magnetic tip-sample interaction is describable through simple models once the
electrostatic artifacts are removed.