Analyzing the Impact of Fault Tolerance Methods in ARM Processors under Soft Errors running Linux and Parallelization APIs

Rodrigues, Gennaro S.; Rosa, Felipe; Oliveira, Ádria Barros de; Kastensmidt, Fernanda Lima; Ost, Luciano; Reis, Ricardo

doi:10.1109/tns.2017.2706519

Cited by 23 publications

(19 citation statements)

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“…In (Velazco et al 2007) it is presented a series of works aimed at mitigating the effects of radiation on integrated circuits. In (Kastensmidt et al 2006;Neuberger et al 2014;Gennaro et al 2017;Aguiar et al 2016;Lazzari et al 2011) we present some of the results that our research group has obtained in the development of techniques aiming the design tolerant to faults due to transients, as the effects due to radiation.…”

Section: Reliabilitymentioning

confidence: 99%

Strategies for Reducing Power Consumption and Increasing Reliability in IoT

Reis

2019

IFIP Advances in Information and Communication Technology

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The Internet of Things (IoT) demands new challenges in the design of computing and electronics components. One of the challenges is the power reduction of this expanding network of connected devices, where the majority is permanently connected. In a large set of applications, another significant issue is reliability, especially on critical areas as health and transport. This paper shows an overview of design strategies that we have developed to reduce power consumption and to increase reliability in circuits that are components of the IoT, as the reduction of the number of transistors in IoT devices, using optimisation techniques and the physical design of circuits tolerant to radiation effects.

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Section: Reliabilitymentioning

confidence: 99%

Strategies for Reducing Power Consumption and Increasing Reliability in IoT

Reis

2019

IFIP Advances in Information and Communication Technology

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“…Em [Velazco 2007] é apresentado uma série de trabalhos visando mitigar efeitos de radiação em circuitos integrados. Em [Kastensmidt 2006] [Neuberger 2014] [Gennaro 2017] [Aguiar 2016] [Lazzari 2011] [Reis 2011B] são apresentados alguns dos resultados que obtivemos no desenvolvimento de técnicas visando o projeto tolerante a falhas devido a transientes como os decorrentes de efeitos de radiação.…”

Section: Confiabilidadeunclassified

Estratégias para a Redução de Consumo de Energia e Aumento de Confiabilidade em IoT

Reis¹

2018

Anais Do Seminário Integrado De Software E Hardware (SEMISH)

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The Internet of Things (IoT) demands new challenges for the design of computing and electronics components. One of the challenges is the power reduction of this large network of connected devices, where the majority is permanently connected. Another important issue, in a large set of applications, especially on critical areas as heath and transport, is reliability. This paper shows an overview of design strategies that we have developed to reduce power consumption and to increase reliability in circuits that are components of the IoT, as reduction of the number of transistors in IoT devices, using optimization techniques and physical design tolerant to radiation effects. Resumo. A Internet das Coisas (IoT) demanda novos desafios no projeto dosdispositivos computacionais e eletrônicos. Um destes desafios é a redução de consumo dos componentes desta grande rede de dispositivos conectados, sendo que a maioria permanece em conexão permanente. Outro aspecto importante, em um grande número de aplicações, especialmente em áreas críticas como saúde e transporte é a confiabilidade. Este artigo visa dar um panorama de estratégias de projeto que temos desenvolvido para a redução de consumo e aumento de confiabilidade de circuitos componentes da IoT, tais como redução do número de transistores nos dispositivos, aplicando técnicas de otimização, novas arquiteturas e projeto físico tolerante a efeitos de radiação. Figura 2. Número de dispositivos conectados na Internet [adaptado de TheConnectivist 2014]

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“…To our knowledge, the only work that addresses the impact of parallelization libraries on the soft error reliability is [15]. This work uses a fault injection framework developed on the basis of an instruction-accurate VP simulator [3] and it employs an ARM Cortex-A9 model, which executes three in-house applications on the top of a Linux Kernel.…”

Section: Related Workmentioning

confidence: 99%