Analyzing stress-strength reliability $$\delta =\text{ P }[U&lt;V&lt;W]$$: a Bayesian and frequentist perspective with Burr-XII distribution under progressive Type-II censoring

Nayal, Amit Singh; Singh, Bhupendra; Tripathi, Vrijesh; Tyagi, Abhishek

doi:10.1007/s13198-024-02264-4

Int J Syst Assur Eng Manag

2024

DOI: 10.1007/s13198-024-02264-4

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Analyzing stress-strength reliability $$\delta =\text{ P }[U<V<W]$$: a Bayesian and frequentist perspective with Burr-XII distribution under progressive Type-II censoring

Amit Singh Nayal,

Bhupendra Singh,

Vrijesh Tripathi

et al.

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Inferences on stress-strength reliability $$R=\text{ P }[Y<X<Z]$$ for progressively type-II censored Weibull half logistic distribution

Nayal,

Tyagi,

Rathi

et al. 2024

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Inferences on stress-strength reliability $$R=\text{ P }[Y<X<Z]$$ for progressively type-II censored Weibull half logistic distribution

Nayal,

Tyagi,

Rathi

et al. 2024

OPSEARCH

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Analyzing stress-strength reliability $$\delta =\text{ P }[U<V<W]$$: a Bayesian and frequentist perspective with Burr-XII distribution under progressive Type-II censoring

Cited by 1 publication

References 27 publications

Inferences on stress-strength reliability $$R=\text{ P }[Y<X<Z]$$ for progressively type-II censored Weibull half logistic distribution

Inferences on stress-strength reliability $$R=\text{ P }[Y<X<Z]$$ for progressively type-II censored Weibull half logistic distribution

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