Analyzing extended wavelength InGaAs photodetectors: the effects of window and active layer thickness on optical characteristics

Seyedein Ardebili, S. Bahareh; Zeinalvand Farzin, Behnam; Kim, Jong Su; Lee, DongKun; Kang, Tae In; Cha, Jong Won; Lee, Sang Jun

doi:10.1007/s11082-024-06328-4

Opt Quant Electron

2024

DOI: 10.1007/s11082-024-06328-4

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Analyzing extended wavelength InGaAs photodetectors: the effects of window and active layer thickness on optical characteristics

S. Bahareh Seyedein Ardebili,

Behnam Zeinalvand Farzin,

Jong Su Kim

et al.

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Analyzing extended wavelength InGaAs photodetectors: the effects of window and active layer thickness on optical characteristics

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References 21 publications

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