Abstract:An improved dual-phase-lagging (DPL) model which reflects size effects caused
by nanostructures is utilized to investigate the two-dimensional thermal
conduction of nano silicon films irradiated by ultrafast laser. The integral
transformation method is used to solve the conduction governing equation
based on the improved DPL model. The variation of the internal temperature
along the thickness direction and the radial direction of the thin film is
analyzed. We find that the temperature increas… Show more
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