Analytical solution for embedded elliptical cracks, and finite element alternating method for elliptical surface cracks, subjected to arbitrary loadings

J-Integral Calculation by Finite Element Processing of Measured Full-Field Surface Displacements

“…The strain energy release rate can be measured directly from the work done to propagate a sub-critical crack [9], and it has long been the practice to calculate the SIF from the applied loads using analytical solutions or finite element methods with knowledge of the specimen geometry and applied load or displacement boundary conditions [10,11]. Elastic-plastic fracture mechanics also enables the extraction of the SIF or strain energy release rate via measurements of the crack opening displacements [12][13][14].…”

Line Spring Model and Its Applications to Part-Through Crack Problems in Plates and Shells

“…1). Referred to the local coordinate system it will be assumed that u l ' u 2 ' u 3 are the displacement components, G l , 8 2 are the rotations of the normal to the neutral surface (in, respectively, x l x 3 and x 2 x 3 planes), and N ij , M ij , and Vi' (i,j=1,2) are, respectively, the membrane, bending, and transverse shear resultants. Let 00 00…”

“…-1-the alternating methods have also been combined in a new hybrid technique to treat three dimensional elliptic crack problems [8], [9]. If one is dealing with a relatively thin-walled structure.…”

Boundary correction factors for elliptical surface cracks emanating from countersunk rivet holes

“…Over the past two decades, considerable effort has been placed on developing computationally efficient methods which provide highly accurate SIF solutions for cracks in three-dimensional bodies. These methods include the conventional finite element method (FEM) [1][2][3][4], the finite element alternating method (FEAM) [5][6][7], the boundary element method (BEM) [8][9], and the three-dimensional weight function method (WFM) [10][11]. With advances in pre and post processors, computer hardware and improvements in equation solvers, time savings are being realized in both geometry development and analysis of complex models.…”