Analytical Prediction of the Thermal Behavior of Semiconductor Power Devices from Room-Temperature I–V Measurements
Sandor Ress,
Gabor Farkas,
Marta Rencz
Abstract:The thermal characterization of power devices is an inevitable task in the industry. Thermal transient testing is one of the major tools for this characterization, as it is not only capable of giving information about the actual thermal parameters but may also reveal the root cause of potential device failures. The testing may occur on single packages or modules on a dedicated standard test bench, or “in situ”, in an actual assembly. The testing process itself is very fast in both cases, on the order of second… Show more
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