Analysis on the application of on-chip redundancy in the safety-critical system

Abstract

IEC 61508-2010 puts special limits on the on-chip redundancy of one single chip, for example the safety integrity level (SIL) is limited up to SIL 3. About this, however, there are no specific explanations. Based on the safety-critical system of on-chip redundancy for a typical programmable logic device (FPGA), this paper proves that the highest SIL is 3; analyses the factors that may impact the safety integrity of redundancy system, and furthermore, provides reasonable solutions. The results show that the use of 1oo2 channel redundancy scheme can effectively improve the safety integrity level of the on-chip redundancy.

Design and Analysis of Double One Out of Two with a Hot Standby Safety Redundant Structure

“…Further: In the process of calculating the equivalent parameters, the rate of the measurable dangerous failure of the whole sub-system is regarded as the measurable risk failure rate of the sub-system, which is recorded as λ tDD , and the single-line P F H is equivalent to the unmeasured dangerous failure of the single system. The rate, denoted as λ tDU , is the diagnostic coverage of the equivalent single-line dangerous failure: (13) Similarly, the equivalent measurable risk failure rate is…”