Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method

Seeck, O. H.; Kaendler, I. D.; Tolan, Metin; Shin, Kwanwoo; Rafailovich, M.; Sokolov, Jonathan; Kolb, Rainer

doi:10.1063/1.126452

Cited by 82 publications

(82 citation statements)

References 11 publications

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“…conference papers Reflectivity curve of a dried film of HFBIII and a fit using a box model for the electron density (insert) (Seeck et al, 2000). In the fit the thickness of the hydrophobin film is 91 Å .…”

Section: Discussionmentioning

confidence: 99%

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Self-assembled films of hydrophobin protein HFBIII from Trichoderma reesei

Kisko¹,

Szilvay²,

Vuorimaa³

et al. 2007

J Appl Crystallogr

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Hydrophobins are a group of small amphiphilic proteins which are known to self-assemble on interfaces. They contain eight conserved cysteine residues, which make four disulfide bridges. A new hydrophobin protein, HFBIII, from the fungus Trichoderma reesei contains one extra cysteine residue, giving the protein a naturally reactive site. The self-assembly of hydrophobin protein HFBIII was studied using grazing-incidence X-ray diffraction and reflectivity. HFBIII self-assembles into a hexagonally ordered monolayer at an air/water interface and also forms crystalline coatings on a silicon substrate. The lattice constants for the hexagonal coatings are a = b = 56.5 Å , = 120 . The selfassembled structure in the HFBIII film is very similar to those formed by two other T. reesei hydrophobins, HFBI and HFBII.

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Section: Discussionmentioning

confidence: 99%

“…The reflectivity was modelled using a box-model (insert in Fig. 4) and fitted with a program (Seeck et al, 2000) that uses the Parrat formalism (Parrat, 1954). The thickness of the hydrophobin film, its electron density and the interfacial roughnesess were fitting parameters.…”

Section: On the Silicon Substratementioning

confidence: 99%

Self-assembled films of hydrophobin protein HFBIII from Trichoderma reesei

Kisko¹,

Szilvay²,

Vuorimaa³

et al. 2007

J Appl Crystallogr

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show abstract

“…Thus the Fourier transfer of the specular Fresnel reflectivity data provides information about the corresponding onedimensional Patterson functions and is used to analyze reflectivity data for structural analysis of low contrast system [10]. So far we considered reflectivity from ideal case.…”

Section: Scattering/reflectivitymentioning

confidence: 99%

“…Secondary maxima in Patterson function indicated layer formation near the solidliquid interface with a period of ∼1 nm. Seeck et al [10] have demonstrated that interfacial parameters can be determined in polymers, where the difference in the electron density is small. By simulation they have shown that, although there is no significant change in specular reflectivity pattern with ∼5% contrast, FT of specular reflectivity data indicates the sensitivity through the secondary maxima in FT.…”

Section: Introductionmentioning

confidence: 99%

“…Sanyal et al [5] have proposed box refining method based on Distorted Wave Born Approximation formalism [6] to determine small fluctuation in EDP of Langmuir Blodgett films. The low electron density contrast problem is also addressed using one-dimensional Patterson function (the Fourier transform (FT)) of normalized reflectivity [7][8][9][10][11][12][13][14][15][16]. The maxima in FT give location of layer thickness, which helps in reducing the number of free parameters during least square fitting.…”

Section: Introductionmentioning

confidence: 99%

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Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

Nayak

Lodha

2011

Journal of Atomic, Molecular, and Optical Physics

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Fine structure features of energy-dependent atomic scattering factor near the atomic absorption edge, are used for structural analysis of low-Z containing thin film structures. The scattering contrast undergoes large and abrupt change as the incident photon energy approaches the natural frequency of the atom and is sensitive to variation in atomic composition and atomic density. Soft X-ray resonant reflectivity is utilized for determination of composition at the buried interfaces with subnanometer sensitivity. This is demonstrated through characterization of Mo/Si multilayers near Si L-edge. We also demonstrate the possibility of probing variation of atomic density in thin films, through the characterization of Fe/B 4 C structure, near B K-edge. Sensitivity of soft X-ray resonant reflectivity to native oxide is demonstrated through characterization of BN films near B K-edge.

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Interfacial adhesion of immiscible component polymers of isoprene rubber and α‐olefin copolymer by chemical reaction using peroxide crosslinking agent

Komori

Sunagawa

Shibata

et al. 2023

J of Applied Polymer Sci

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We investigated the interfacial adhesion of immiscible component polymers of isoprene rubber (IR) and α-olefin copolymer (αOC) by chemical reaction using peroxide crosslinking agent which was used for the crosslinking of IR. Fibrillar structure of the IR elongated from the αOC domains was observed by scanning electron microscope and the tensile stress of the IR was enhanced without sacrifice of the excellent elongation in the two-phase blends of IR and αOC obtained after crosslinking reaction, suggesting that adhesion exists at the interface. The confocal-Raman imaging of the bilayer films of IR and αOC revealed that mixed layer having a distance about 358 nm was formed at the interface by the chemical reaction. Owing to the existence of the mixed layer at the interface, the adhesion strength was larger as the mixed layer at the interface was thicker. Thus interfacial adhesion exists in the immiscible component polymers of IR and αOC by the chemical reaction and the tensile stress was enhanced without sacrifice of the excellent elongation.

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Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method

Cited by 82 publications

References 11 publications

Self-assembled films of hydrophobin protein HFBIII from Trichoderma reesei

Self-assembled films of hydrophobin protein HFBIII from Trichoderma reesei

Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

Interfacial adhesion of immiscible component polymers of isoprene rubber and α‐olefin copolymer by chemical reaction using peroxide crosslinking agent

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