2016 IEEE Electrical Insulation Conference (EIC) 2016
DOI: 10.1109/eic.2016.7548625
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of turn insulation degradation under voltage surge stress

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 2 publications
0
1
0
Order By: Relevance
“…Unlike Type I machines, which largely use random-wound coils and in which the situation where the first and last coil are next to each other can be encountered, high voltage machines present formed wound coils [11]. These coils are constituted of flat wires stacked on top of each other (Fig.…”
Section: Turn-to-turn Voltagementioning
confidence: 99%
“…Unlike Type I machines, which largely use random-wound coils and in which the situation where the first and last coil are next to each other can be encountered, high voltage machines present formed wound coils [11]. These coils are constituted of flat wires stacked on top of each other (Fig.…”
Section: Turn-to-turn Voltagementioning
confidence: 99%