Analysis of Tip Stability in Adhesion Process in AFM Using Potential Energy Surface: Stability Versus Dissipation

Abstract

We analyze the stability of the atomic configurations of tips in the adhesion process in noncontact atomic force microscopy (AFM) using a potential energy surface (PES). We calculate the PES for two types of atomic configurations of the tip as typical cases of reconstruction and irreversible change during the adhesion process. The stability of the tips after atomic contact with the surface is explained on the basis of the calculated PESs, which are affected by the strength of the atomic bond between the tip and the surface. It is shown from the computational model for the AFM that an unstable tip leads to a larger energy dissipation compared to that for a stable tip.

Computational model for friction force microscopy: stick-slip motion and thermal energy on surface

“…We have already applied this coupling method to the AFM system and shown the mechanism of energy dissipation observed in AFM experiments. [33][34][35] The present FFM model will reproduce the sawtooth-like modulation of friction force that has been observed on the NaCl surface in Ref. 6.…”