Analysis of the quality factor of the optical half‐wavelength resonator

Abstract

An electrodynamic analysis of an optical resonator comprising a half‐wavelength dielectric layer that is covered from both sides by quarter‐wavelength layers with higher and lower refractive indices (RIs) is carried out.For such a resonator, the dependences of the external quality factor on number and RIs of the layers are obtained first. That allows one to determine minimum number of the layers in the structure to achieve the required quality factor at practically any contrast of the RIs. The results of this study provide an easy way to optimize the structures of 1D photonic crystal devices, particularly high‐selectivity bandpass filters. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:1613–1616, 2013; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27662

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