Analysis of the Minute Differences between the Internal Structures of Green‐Emitting Quantum Dots Via Synchrotron‐Based X‐Ray Photoelectron Spectroscopy
Dong‐Jin Yun,
Nayoun Won,
Young Mo Sung
et al.
Abstract:The development of an analytical method for determining the properties of quantum dots (QDs) is crucial for improving the optical performance of QD‐based displays. Therefore, synchrotron‐based X‐ray photoelectron spectroscopy (XPS) is designed here to accurately characterize the chemical and structural differences between different QDs. This method enables the determination of the reason for the minimal differences between the optical properties of different QDs depending on the synthesis process, which is dif… Show more
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