Analysis of the imaging method for assessment of the smile of laser diode bars

Abstract

We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 microm for a mean wavelength of lambda approximately 800 nm. Our results suggest that, with the current state-of-the-art, the formation of imaging methods for LDB smile assessment can be used to assess smile heights > or = 1 microm.

The SMILE Effect in the Beam Propagation Direction Affects the Beam Shaping of a Semiconductor Laser Bar Array

“…These studies have primarily focused on comprehending the underlying mechanism behind the SMILE effect, elucidating its intricate workings, and providing valuable insights into this phenomenon [1,2]. Furthermore, researchers have devoted their efforts to developing effective testing methodologies for evaluating the presence and magnitude of the SMILE effect [3][4][5]. Moreover, scientists have also explored diverse strategies to mitigate or reduce the impact of the SMILE effect.…”