Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R–F sputtering

Chaik, M.; Moumen, S. Ben; Bouferra, Rachid; Outzourhit, A.; Essaleh, L.

doi:10.1016/j.spmi.2019.106319

Search citation statements

Order By: Relevance

Paper Sections

Select...

Structural Properties1

Sputtering Deposition Technique1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2022

2024

Publication Types

Select...

Article3

Other2

Relationship

Self Cite0

Independent5

Authors

Journals

Cited by 6 publications

(2 citation statements)

References 24 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…120 Vanadium (V)-doped ZnTe thin films showed an amorphous nature, where metal doping led to an amorphous nature, 128 while nickel doping did not change the properties of these films greatly. 138 On depositing these thin films with varying angles through the thermal evaporation technique, XRD analysis confirmed that at lower angles, the films were Te rich, at moderate angles with a stoichiometric nature and Zn rich at higher angles. 122 Hence, the structural properties of ZnTe films are affected by several factors, as discussed herein.…”

Section: Structural Propertiesmentioning

confidence: 88%

See 1 more Smart Citation

An overview on the role of ZnTe as an efficient interface in CdTe thin film solar cells: a review

et al. 2022

View full text Add to dashboard Cite

show abstract

Section: Structural Propertiesmentioning

confidence: 88%

“…137 These films were also deposited on a glass substrate with 50 W RF power and B1.5 Â 10 À6 Torr base vacuum. 138 To develop intermediate band semiconductors, ZnTe:O films were deposited using this technique. 139 The ZnTe:Cu thin films prepared were applied as back contacts in CdS/CdTe devices.…”

Section: Sputtering Deposition Techniquementioning

confidence: 99%