2019
DOI: 10.1007/s00542-019-04386-3
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Analysis of surface potential for dual-material-double-gate MOSFET based on modeling and simulation

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Cited by 32 publications
(4 citation statements)
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“…Transistor count also depends on transistor size. Different high dielectric constant materials are also used for lesser dimension transistor [46][47][48][49][50]. The number of transistor count differs for different adiabatic logic families depending on its schematic structures and energy recovery technique.…”
Section: Resultsmentioning
confidence: 99%
“…Transistor count also depends on transistor size. Different high dielectric constant materials are also used for lesser dimension transistor [46][47][48][49][50]. The number of transistor count differs for different adiabatic logic families depending on its schematic structures and energy recovery technique.…”
Section: Resultsmentioning
confidence: 99%
“…With positive trap charges the surface potential curve moves up depicting an increase in the potential and vice-versa can be seen for negative trap charges which are clearly in agreement with. 39 This variation in surface potential is because of trap charges present in the SiO 2 oxide layer. Presence of positive trap charges decreases the energy band gap between n-type (Source/Drain) to ptype (Channel) as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Hafnium oxide is employed as a promising gate oxide material because of its excellent interface with Si, high-k value (22), big bandgap (5.6 eV), and conduction band offset (1.4 eV) with regard to Si. Most significantly, a decent electrical interaction with Si makes it a prospective alternative to silicon dioxide [17][18][19][20][21].…”
Section: Structural Dimensions Ie W mentioning
confidence: 99%