1993
DOI: 10.1016/0038-1101(93)90050-z
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Analysis of surface plasmon polariton enhancement in photodetection by Al—GaAs Schottky diodes

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Cited by 14 publications
(7 citation statements)
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“…Prism coupling to SPPs on a suitable detection structure was one of the first types of SPP detectors investigated . The Kretschmann and Otto coupling configurations have been investigated, although the latter has been more popular in experimental work, likely because the detection structures can be fabricated independently, then the prism aligned to the detector in the set‐up. Metal‐insulator‐metal tunnel structures , and metal‐organic‐metal rectifying structures (for solar cell application) have also been investigated via prism coupling.…”
Section: Prism‐coupled Detectorsmentioning
confidence: 99%
“…Prism coupling to SPPs on a suitable detection structure was one of the first types of SPP detectors investigated . The Kretschmann and Otto coupling configurations have been investigated, although the latter has been more popular in experimental work, likely because the detection structures can be fabricated independently, then the prism aligned to the detector in the set‐up. Metal‐insulator‐metal tunnel structures , and metal‐organic‐metal rectifying structures (for solar cell application) have also been investigated via prism coupling.…”
Section: Prism‐coupled Detectorsmentioning
confidence: 99%
“…Our previous interest in SPP enhanced Schottky diode structures 11,12 at ambient temperature was carried forward to studies on cooled, low-barrier diode structures 4 ͑using a fixed-gap coupler͒ and remains a topic ͑and a very useful test bed͒ that we have been concerned to tackle with the current variable-gap coupler. In the context of Schottky diode studies it is noted that the integral Otto approach may still fall foul of the problems associated with squeezer arrangements.…”
Section: B Gap Control In Otto Couplersmentioning
confidence: 99%
“…In this process, the real and imaginary parts of the dielectric function for Al, GaAs and the glass prism were based on values given in the literature (Tamm et 1993, Palik 1985; at given wavelength, these parameters were treated as invariant in the modeling process. Fits for different light wavelengths are shown in Figure 5.…”
Section: Fitting Parameters Invariant Parametersmentioning
confidence: 99%
“…In the first section, the experimental technique for measuring ATR is described and the standard matrix formalism is briefly presented. Previously obtained experimental reflectance data by one of us (Tamm et al 1993), for an Al/GaAs sample, is used to probe the optical properties and thickness of the Al-oxide layer. The second section is devoted to results and discussion, and we show how sensitive is the theoretical reflectance to certain parameters.…”
mentioning
confidence: 99%