Analysis of statistical nature of induced voltages at key points in computer box cavity in different frequency ranges

Eryan, 闫二艳 Yan; Fanbao, 孟凡宝 Meng; Hongge, 马弘舸 Ma

doi:10.3788/hplpb20142607.73205

强激光与粒子束

2014

DOI: 10.3788/hplpb20142607.73205

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Analysis of statistical nature of induced voltages at key points in computer box cavity in different frequency ranges

闫二艳 Yan Eryan¹,

孟凡宝 Meng Fanbao²,

马弘舸 Ma Hongge³

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Analysis of statistical nature of induced voltages at key points in computer box cavity in different frequency ranges

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