2013
DOI: 10.5121/vlsic.2013.4205
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Analysis of Small-Signal Parameters of 2-D Modfet with Polarization Effects for Microwave Applications

Abstract: An improved analytical two dimensional (2-D) model for AlGaN/GaN modulation doped field effect transistor (MODFET) has been developed. The model is based on the solution of 2-D Poisson's equation.The model includes the spontaneous and piezoelectric polarization effects. The effects of field dependent mobility, velocity saturation and parasitic resistances are included in the current voltage characteristics of the developed two dimensional electron gas (2-DEG) model. The small-signal microwave parameters have b… Show more

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Cited by 3 publications
(3 citation statements)
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References 17 publications
(24 reference statements)
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“…The threshold voltage Vth is defined as the applied gate voltage for which the channel is completely depleted, and is considered as the minimum potential in the channel [23]. The dependence of Vth on temperature and Al mole fraction m (m = 0.32 for structure A, and m = 0.83 for B), including the effects of both spontaneous and piezoelectric charge polarization, is given by the following expressions: without cap [24]:…”
Section: Threshold Voltagementioning
confidence: 99%
“…The threshold voltage Vth is defined as the applied gate voltage for which the channel is completely depleted, and is considered as the minimum potential in the channel [23]. The dependence of Vth on temperature and Al mole fraction m (m = 0.32 for structure A, and m = 0.83 for B), including the effects of both spontaneous and piezoelectric charge polarization, is given by the following expressions: without cap [24]:…”
Section: Threshold Voltagementioning
confidence: 99%
“…For a given aluminum mole fraction, there is a certain critical thickness of barrier layer. Equation (6) shows that the device remains completely strained for Al content up to 38% and fully relaxed for Al content greater than 67% for thickness range of 200-400Å.…”
Section: Advances In Materials Science and Engineeringmentioning
confidence: 99%
“…Capacitancevoltage characteristics are widely used as a diagnostic tool for semiconductor. The C-V characteristics also provide more information about the nonlinearity of the device for the large signal models [3][4][5][6]. Low noise HEMTs are promising devices for millimetre wave due to their excellent high frequency and low noise performances.…”
Section: Introductionmentioning
confidence: 99%