Analysis of slope-intercept plots for arrays of electron field emitters

Abstract

In electron field emission experiments, a linear relationship in plots of slope vs. intercept obtained from Fowler-Nordheim analysis is commonly observed for single tips or tip arrays. By simulating samples with many tips, it is shown here that the observed linear relationship results from the distribution of input parameters, assuming a log-normal distribution for the radius of each tip. Typically, a shift from the lower-left to the upper-right of a slope-intercept plot has been correlated with a shift in work function. However, as shown in this paper, the same effect can result from a variation in the number of emitters

Statistical dependence of nanocomposite emission parameters

“…Statistical similarity between this "cloud" with calculations, published in [5], allow us to suggest that physical laws described there are probably existed. That is, the distribution of effective heights should be lognormal.…”

“…The statistical calculations based on the Fowler-Nordheim theory are of special interest [3][4][5]. In [5] the fluctuation spread of emission parameters was theoretically proved and SK-chart was drawn (Seppen-Katamuki, the slope-intercept plot in Fowler-Nordheim coordinates).…”

“…In [5] the fluctuation spread of emission parameters was theoretically proved and SK-chart was drawn (Seppen-Katamuki, the slope-intercept plot in Fowler-Nordheim coordinates). It is the aim of the present paper to obtain a similar diagram in the field-emission experiment and identify its features, opening the way to an understanding of the fundamental principles of operation of such multiple-point structures.…”

Simulation of Figures of Merit for Barristor Based on Graphene/Insulator Junction

“…The slope of the straight line was estimated to be −689 V. The tunneling barrier heights extracted from the slopes were 2.10 eV (by the revised FNT equation) and 2.11 eV (by the traditional FNT equation), respectively. Therefore, the results of the barrier height calculation using the original and revised FNT equation were similar because they used an identical β [ 19 , 20 , 21 , 22 , 23 , 24 ].…”

Исследование С Применением SK-анализа Вольт-Амперных Характеристик Нанокомпозитных Полевых Эмиттеров На Основе Графена

“…В 2013 г. американский ученый A. Persaud смодели-ровал шумовую зависимость ВАХ-ФН на SK-диаграмме посредством введения заданного распределения вирту-альных наноцентров по высотам, радиусам и работам выхода [14]. Он показал, что смещение стохастического облака на SK-диаграмме налево и вниз может быть вызвано изменением не только работы выхода, но и количества эмитирующих наноцентров.…”