Analysis of RF Noise in LDO and Establishment of Noise Immunity

Hino, Takahiro; Watanabe, H.

doi:10.1109/emceurope.2019.8872083

Cited by 3 publications

(2 citation statements)

References 6 publications

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“…In (6), W and L are width and length of MOS channel. The I 0 is a dc current when an aspect ratio W/L is equal to one and gate-source voltage V GS Mx is equal to zero volts.…”

Section: Integrated Otasmentioning

confidence: 99%

An EMI susceptibility study of different integrated operational transconductance amplifiers

Krolak

Horský

2023

Journal of Electrical Engineering

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This paper presents a comparative EMI susceptibility study of different integrated operational transconductance amplifier (OTA) topologies. We analyzed conventional well-known amplifier topologies based on the Miller OTA and folded cascode concepts with lower power consumption. The output dc voltage shifts induced by power supply and input common mode high frequency disturbances are presented. On top of the EMI susceptibility comparison, we discuss PSRR and CMRR within large and small excitation signal with a new simulation setup. Even more, the back-gate connections of differential MOS pair in OTA input stage are investigated for EMI susceptibility impact as well.

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“…In (6), W and L are width and length of MOS channel. The I 0 is a dc current when an aspect ratio W/L is equal to one and gate-source voltage V GS Mx is equal to zero volts.…”

Section: Integrated Otasmentioning

confidence: 99%

An EMI susceptibility study of different integrated operational transconductance amplifiers

Krolak

Horský

2023

Journal of Electrical Engineering

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“…Over the past years, researchers have focused on characterizing the effect of single-tone EMI on specific ICs and extracting their susceptibility profiles [12]- [16]. In addition, some authors' work aim to improve the application of EM susceptibility testing methods and predict IC immunity through analytical modelling and numerical simulation [17]- [20].…”

Section: Introductionmentioning

confidence: 99%

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress

et al. 2022

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The reliable operation of an integrated circuit can be affected by environmental changes, such as of multiple frequency electromagnetic (EM) disturbances and temperature variations. This paper compares the performance of two oscillator circuits, namely a current-starved voltage controlled oscillator and a ring oscillator integrated into a chip, in terms of their immunity to multitone direct power injection while under the influence of thermal stress. The objective is to demonstrate by the means of measurements the synergistic effect caused by multitone EM disturbances in a test chip, in contrast to the conventional single-tone EM disturbances. Moreover, the multitone immunity levels of integrated blocks with different architectures but similar functionality are analyzed at extreme temperature deviations. Bayesian networks (BN) are applied in order to visualize the probability of circuit failure due to multitone disturbances and temperature influence. Additionally, noisy-OR and improved-adaptive-recursive-noisy-OR (I-ARNOR) probabilistic models are implemented to identify the types of causal interactions (i.e. inhibition and positive causality) between multitone disturbances and to predict the probability of failure due to higher order multitone disturbances, respectively.

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Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

Yan²,

et al. 2021

IEEE Access

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Analysis of RF Noise in LDO and Establishment of Noise Immunity

Cited by 3 publications

References 6 publications

An EMI susceptibility study of different integrated operational transconductance amplifiers

An EMI susceptibility study of different integrated operational transconductance amplifiers

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress

Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

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