2017 15th IEEE International New Circuits and Systems Conference (NEWCAS) 2017
DOI: 10.1109/newcas.2017.8010092
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of reversion losses in charge pumps and its impact on efficiency for low power design

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(4 citation statements)
references
References 5 publications
0
4
0
Order By: Relevance
“…Figure 3 is used to illustrate the influence of the leakage current, V B and V C are the voltages of drain and gate of MN3 and MP3, MN3 works in triode region from 0 to t1, and works in saturation region from t1 to t2, the duration of the transition is t0. The power consumption introduced by the overlapping of CLK1 and CLK2 is given in (2) [27]:…”
Section: Circuit Of Nvgmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 3 is used to illustrate the influence of the leakage current, V B and V C are the voltages of drain and gate of MN3 and MP3, MN3 works in triode region from 0 to t1, and works in saturation region from t1 to t2, the duration of the transition is t0. The power consumption introduced by the overlapping of CLK1 and CLK2 is given in (2) [27]:…”
Section: Circuit Of Nvgmentioning
confidence: 99%
“…In addition to the optimization of RF switches alone, there are some works that design RF switches together with other modules, such as ESD [23,24], antenna [13], impedance matching networks [12] and NVG [25][26][27]. The performance of RF switches in these works is not outstanding, but the whole module can achieve good performance.…”
Section: Introductionmentioning
confidence: 99%
“…In a practical case, the actual CP output performance is further degraded as it suffers from various power losses during the pumping process. The common loss that is encountered in CP includes redistribution loss [12], conduction loss [32,33], reversion loss [34,35], short circuit loss [36] and switching loss [32]. For low voltage CP, reversion, conduction and switching losses are periodized to be eliminated or minimized as they are the main factors deteriorating the CP performance compared to other losses [37].…”
Section: Rcp Model / Architecture a Charge Pumpmentioning
confidence: 99%
“…As an antithetical to the aforementioned losses, reverse charge leakage are significant in advanced CMOS technology which is attributed to shorter device length. The reverse sharing phenomenon causes current to flow from the Nth,cp node to (N-1)th,cp by indecorous switching effects through Vth variation, lack of gate-to-source voltage(Vgs) drive, and short circuit dissipation [51][52][53].…”
Section: ) Reverse Charge Sharing and Leakagementioning
confidence: 99%