2015
DOI: 10.1016/j.matlet.2015.01.105
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Analysis of recombination path for Cu(In,Ga)Se2 solar cells through luminescence

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Cited by 13 publications
(4 citation statements)
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References 19 publications
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“…Moreover, from the measurement result, i.e., the luminescence intensity of free charge carriers, the internal separation of the quasi-Fermi levels ΔE F can be derived. [6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25] Especially photoluminescence (PL) is very interesting for the following two reasons. First, PL allows insight into the recombination of photogenerated charge carriers under real operation conditions in contrast to electroluminescence (EL) where recombination of electrically injected charge carriers is investigated in the dark.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, from the measurement result, i.e., the luminescence intensity of free charge carriers, the internal separation of the quasi-Fermi levels ΔE F can be derived. [6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25] Especially photoluminescence (PL) is very interesting for the following two reasons. First, PL allows insight into the recombination of photogenerated charge carriers under real operation conditions in contrast to electroluminescence (EL) where recombination of electrically injected charge carriers is investigated in the dark.…”
Section: Introductionmentioning
confidence: 99%
“…For homo-junction solar cells, TRPL is not a single exponential decay curve, and it is influenced by surface recombination, doping and internal electrical field, becoming two-exponential decay or more complex non-exponential decay. 13,14 Internal electrical field in PN junction would modify distributions of carriers significantly. 6,15 Matthias Maiberga has given the full expression of TRPL curve I(t) considering diffusion, drifting, surface recombination, and non-uniform absorption.…”
Section: Introductionmentioning
confidence: 99%
“…Исследования фотолюминесценции (ФЛ) при низких уровнях непрерывного оптического возбуждения часто используются для оценки кристаллического качества CIGSe [4,6,17,18,21]. Обнаружение стимулированного и лазерного излучения в пленках твердых растворов CIGSe при высоких уровнях импульсного лазерного возбуждения [22] открывает новые возможности оценки их структурного совершенства, так как позволяет произвести сравнительную оценку относительной концентрации свободных неравновесных носителей заряда,…”
Section: Introductionunclassified