Analysis of Quasi-monoenergetic neutron SEU cross sections for Terrestrial applications

Abstract

This paper investigates the single event upset sensitivity of Bulk SRAMs to neutron and proton irradiations with energy range from 20 to 180 MeV. The technology sensitivity is analyzed with both quasimonoenergetic neutron and proton experiments. Analytical and simulation based correction methods of the neutron cross section are presented and validated. Then, neutron and proton cross section are compared. Soft error rate with proton data and neutron data are presented.Index Terms-Bulk technologies, neutron and proton effects, soft error rate (SER), single-event upset (SEU).