Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Kramberger, Christian; Mittelberger, Andreas; Hofer, Christoph; Meyer, Jannik C.

doi:10.1002/pssb.201700176

Cited by 3 publications

(1 citation statement)

References 21 publications

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“…Experimental work over this period focused on reducing the electron dose required for imaging radiation-sensitive samples. This reduction in dose was achieved by spreading the dose out over several copies of the sample (as in cryo electron microscopy) and by increasing the signal-to-noise ratio in noisy images acquired at low doses through image processing and electron counting [18][19][20][21][22][23][24][25][26][27][28][29]. However, this research used conventional microscopic imaging methods and did not exploit the reduction in dose enabled by quantum protocols.…”

Section: Introductionmentioning

confidence: 99%

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

et al. 2019

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Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron diffraction gratings has made it possible to incorporate a Mach-Zehnder interferometer in a transmission-electron microscope (TEM). Therefore, the limits of performance of IFM with such an interferometer and a shot-noise limited electron source (such as that in a TEM) are of interest. In this work, we compared the error probability and sample damage for ideal IFM and classical imaging schemes, through theoretical analysis and numerical simulation. We considered a sample that is either completely transparent or completely opaque at each pixel. In our analysis, we also evaluated the impact of an additional detector for scattered electrons. The additional detector resulted in reduction of error by up to an order of magnitude, for both IFM and classical schemes. We also investigated a sample re-illumination scheme based on updating priors after each round of illumination and found that this scheme further reduced error by a factor of two. Implementation of these methods is likely achievable with existing instrumentation and would result in improved resolution in low-dose electron microscopy.

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Section: Introductionmentioning

confidence: 99%

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

et al. 2019

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Software electron counting for low-dose scanning transmission electron microscopy

2018

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The performance of the detector is of key importance for low-dose imaging in transmission electron microscopy, and counting every single electron can be considered as the ultimate goal. In scanning transmission electron microscopy, low-dose imaging can be realized by very fast scanning, however, this also introduces artifacts and a loss of resolution in the scan direction. We have developed a software approach to correct for artifacts introduced by fast scans, making use of a scintillator and photomultiplier response that extends over several pixels. The parameters for this correction can be directly extracted from the raw image. Finally, the images can be converted into electron counts. This approach enables low-dose imaging in the scanning transmission electron microscope via high scan speeds while retaining the image quality of artifact-free slower scans.

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Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector

Song

Allen

Gao

et al. 2019

Sci Rep

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Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions.

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Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Cited by 3 publications

References 21 publications

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

Software electron counting for low-dose scanning transmission electron microscopy

Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector

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