Abstract:We demonstrate the mapping of lateral photoexcited charge carrier density profiles in a Si wafer that is illuminated in a spot by strongly absorbed light, using an infrared camera. The radial decay measured for the charge carrier density yields information on the effective carrier lifetime. The lifetime is extracted from the infrared camera image by modeling the transport. The carrier lifetime determined with the infrared camera technique is in accord with results obtained by conventional transient microwave r… Show more
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.