Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

Hinrichs, Karsten; Gensch, Michael; Esser, N.

doi:10.1366/000370205774783106

Cited by 79 publications

(83 citation statements)

References 101 publications

(106 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Although single wavelength (integrated) Mach-Zehnder interferometers (MZI) are widely employed for (bio-)chemical sensing, especially in the visible spectral range [17,18], a report on directly recording a liquid sample's absorption and dispersion spectrum in the Mid-IR using a MZI is, to the best of our knowledge, yet pending. The reader is, however, pointed to infrared spectroscopic ellipsometry [19] and dispersive Fourier transform spectroscopy [20,21,22] that were used in (far-) infrared spectroscopic measurements of the complex dielectric function, mostly in reflection measurements.…”

Section: 29 Page 2 Ofmentioning

confidence: 99%

A quantum cascade laser-based Mach–Zehnder interferometer for chemical sensing employing molecular absorption and dispersion

et al. 2018

View full text Add to dashboard Cite

We employ a novel spectroscopic setup based on an external cavity quantum cascade laser and a Mach-Zehnder interferometer to simultaneously record spectra of absorption and dispersion of liquid samples in the mid-infrared. We describe the theory underlying the interferometric measurement and discuss its implications for the experiment. The capability of simultaneously recording a refractive index and absorption spectrum is demonstrated for a sample of acetone in cyclohexane. The recording of absorption spectra is experimentally investigated in more detail to illustrate the method's capabilities as compared to direct absorption spectroscopy. We find that absorption signals are recorded with strongly suppressed background, but with smaller absolute sensitivity. A possibility of optimizing the setup's performance by unbalancing the interferometer is presented.

show abstract

Section: 29 Page 2 Ofmentioning

confidence: 99%

A quantum cascade laser-based Mach–Zehnder interferometer for chemical sensing employing molecular absorption and dispersion

et al. 2018

View full text Add to dashboard Cite

show abstract

“…Further experimental details are reported elsewhere [28]. IRSE measurements [29,30] were made under UHV conditions using a photometric ellipsometer attached to a Bruker Vertex 70 series Fourier Transform Interferometer with a spectral resolution of 16 cm À1 . Ellipsometry measures the change of the polarization state upon reflection or transmission from the sample surface.…”

mentioning

confidence: 99%

“…Ellipsometry measures the change of the polarization state upon reflection or transmission from the sample surface. The measurements were performed in reflection at 65 angle of incidence and the polarization state of the reflected radiation was analyzed [30]. The ellipsometric parameters, c and Á, are related to the complex reflection coefficients for polarization perpendicular and parallel to the plane of incidence, r s and r p , by r p =r s ¼ tanc expðiÁÞ.…”

mentioning

confidence: 99%

Structure of Si(111)-In Nanowires Determined from the Midinfrared Optical Response

Chandola

Hinrichs²,

Gensch³

et al. 2009

Phys. Rev. Lett.

Self Cite

View full text Add to dashboard Cite

The anisotropic optical response of Sið111Þ À ð4 Â 1Þ=ð8 Â 2Þ-In in the midinfrared, where ab initio studies predict significant changes in the band structure between competing models of this important quasi-1D system, has been measured using infrared spectroscopic ellipsometry (IRSE) and reflection anisotropy spectroscopy (RAS). Both IRSE and RAS of the (8 Â 2) phase show that the anisotropic Drude tail of the (4 Â 1) phase is replaced by two peaks at 0.50 and 0.72 eV, which appear in ab initio optical response calculations for the hexagon model of the (8 Â 2) structure, but not the trimer model.

show abstract

“…Ellipsometry in the infrared provides an emerging powerful technique for the structural analysis of organic films [196].…”

Section: Ellipsometrymentioning

confidence: 99%

Ultraviolet and Visible Spectroscopy

Gauglitz

2008

Ullmann's Encyclopedia of Industrial Chemistry

View full text Add to dashboard Cite

The article contains sections titled: 1. Introduction 1.1. Comparison with Other Spectroscopic Methods 1.2. Development and Uses 2. Theoretical Principles 2.1. Electronic States and Orbitals 2.2. Interaction Between Radiation and Matter 2.2.1. Dispersion 2.2.2. Absorption 2.2.3. Scattering 2.2.4. Reflection 2.2.5. Band Intensity 2.3. The Lambert–BeerLaw 2.3.1. Definitions 2.3.2. Deviations from the Lambert ‐ Beer Law 2.4. Photophysics 2.4.1. Energy Level Diagram 2.4.2. Deactivation Processes 2.4.3. Transition Probability and Fine Structure of the Bands 2.5. Chromophores 2.6. Optical Rotatory Dispersion and Circular Dichroism 2.6.1. Generation of Polarized Radiation 2.6.2. Interaction with Polarized Radiation 2.6.3. Optical Rotatory Dispersion 2.6.4. Circular Dichroism and the Cotton Effect 2.6.5. Magnetooptical Effects 3. Optical Components and Spectrometers 3.1. Principles of Spectrometer Construction 3.1.1. Sequential Measurement of Absorption 3.1.2. Multiplex Methods in Absorption Spectroscopy 3.2. Light Sources 3.2.1. Line Sources 3.2.2. Sources of Continuous Radiation 3.2.3. Lasers 3.3. Selection of Wavelengths 3.3.1. Prism Monochromators 3.3.2. Grating Monochromators 3.3.3. Electro‐Acoustic and Opto‐Acoustic Wavelength Generation 3.4. Polarizers and Analyzers 3.5. Sample Compartments and Cells 3.5.1. Closed Compartments 3.5.2. Modular Arrangements 3.5.3. Open Compartments 3.6. Detectors 3.7. Optical Paths for Special Measuring Requirements 3.7.1. Fluorescence Measurement 3.7.2. Measuring Equipment for Polarimetry, ORD, and CD 3.7.3. Reflection Measurement 3.7.4. Ellipsometry 3.8. Effect of Equipment Parameters 3.9. Connection to Electronic Systems and Computers 4. Uses of UV ‐ VIS Spectroscopy in Absorption, Fluorescence, and Reflection 4.1. Identification of Substances and Determination of Structures 4.2. Quantitative Analysis 4.2.1. Determination of Concentration by Calibration Curves 4.2.2. Classical Multicomponent Analysis 4.2.3. Multivariate Data Analysis 4.2.4. Use in Chromatography 4.3. Fluorimetry 4.3.1. Inner Filter Effects 4.3.2. Fluorescene and Scattering 4.3.3. Excitation Spectra 4.3.4. Applications 4.4. Reflectometry 4.4.1. Diffuse Reflection 4.4.2. Color Measurement 4.4.3. Regular Reflection 4.4.4. Determination of Film Thickness 4.4.5. Ellipsometry 4.5. Resonance Methods 4.5.1. SurfacePlasmon Resonance 4.5.2. Grating Couplers 4.5.3. Other Evanescent Methods 4.5.4. Interferometric Methods 4.6. On‐Line Process Control 4.6.1. Process Analysis 4.6.2. Measurement of Film Thicknesses 4.6.3. Optical Sensors 4.7. Measuring Methods Based on Deviations from the Lambert – Beer Law 5. Special Methods 5.1. Derivative Spectroscopy 5.2. Dual‐Wavelength Spectroscopy 5.3. Scattering 5.3.1. Turbidimetry 5.3.2. Nephelometry 5.3.3. Photon Correlation Spectroscopy 5.4. Luminescence, Excitation, and Depolarization Spectroscopy, and Measurement of Lifetimes 5.5. Polarimetry 5.5.1. Sugar Analysis 5.5.2. Cellulose Determination 5.5.3. Stereochemical StructuralAnalysis 5.5.4. Use of Optical Activity Induced by a Magnetic Field 5.6. Photoacoustic Spectroscopy (PAS)

show abstract

Analysis of Organic Films and Interfacial Layers by Infrared Spectroscopic Ellipsometry

Cited by 79 publications

References 101 publications

A quantum cascade laser-based Mach–Zehnder interferometer for chemical sensing employing molecular absorption and dispersion

A quantum cascade laser-based Mach–Zehnder interferometer for chemical sensing employing molecular absorption and dispersion

Structure of Si(111)-In Nanowires Determined from the Midinfrared Optical Response

Ultraviolet and Visible Spectroscopy

Contact Info

Product

Resources

About