Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis

Development of a method for direct elemental analysis of lithium ion battery degradation products by means of total reflection X-ray fluorescence

“…This opens a wide field of different alternative anode materials like silicon or other silicon based anodes, especially with respect to the hazardous HF acid digestion [30,31] and with regard to the reactivity of Si with HF (stemming from LiPF6 in the electrolyte) [32][33][34][35][36]. Furthermore it is beneficial that an acid assisted digestion might be avoided which facilitate the analysis of these novel anode materials for further research.…”

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

“…The sensitivity of SR-induced TXRF (SR-TXRF) is several orders of magnitude greater than what can be achieved using conventional sources (e.g., X-ray tubes) [12,16,[19][20][21][22][23][24]. Furthermore, if the SR is monochromatized with a high-resolution crystal monochromator, instead of a wide band pass system such as a multilayer, the technique can be extended to X-ray absorption spectroscopy (XAS) to gain chemical information on a specific element of interest [25][26][27][28][29].…”

X-Ray Fluorescence Spectrometry

“…After the first experiments in 1971 [106] and 1975 [107] and subsequent pioneer work [108,109] this technique came into common use for detection of ultratrace elements, with particular reference to environmental samples and liquids, with the advantage of needing greatly reduced volumes. In TXRF, the primary X-rays irradiate the surface at grazing angle of incidence.…”