Abstract:Additional Information:• This article was published in the Journal of Applied Physics [ c Amer- The application of a multistate Markov chain is considered as a model of electromigration interconnect degradation and eventual failure. Such a model has already been used ͓Tan et al., J. Appl. Phys. 102, 103703 ͑2007͔͒, maintaining that, in general, it leads to a failure distribution described by a gamma mixture, and that as a result, this type of distribution ͑rather than a lognormal͒ should be used as a prior in … Show more
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