Analysis of mobile phone's immunity to electrostatic discharge soft failures

Kwon, Soon Jae; Kim, Ki Hyuk; Kim, Yongsup; Kim, Austin S.

doi:10.1109/apemc.2010.5475557

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Cited by 3 publications

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“…The simulation indicates that a change to the circuit, or additional ESD protection would be needed to avoid damage during an ESD test. Other results can be found in [12][13][14][15].…”

Section: Expample Resultsmentioning

confidence: 75%

Simulation challenges in system level electrostatic discharge modeling

Pommerenke

Fan

Drewniak

2016

2016 IEEE/ACES International Conference on Wireless Information Technology and Systems (ICWITS) and Applied Computational Elect

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Simulation of system level electrostatic discharge (ESD) is challenging due to the complexity of electronic systems, missing soft failure models for ICs and the modeling of arcing. This paper details these difficulties and points at examples of successful solutions for modeling ESD generators in SPICE and full wave, modeling of arc behavior, and simulation of ESD into products causing soft-failures.

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“…The simulation indicates that a change to the circuit, or additional ESD protection would be needed to avoid damage during an ESD test. Other results can be found in [12][13][14][15].…”

Section: Expample Resultsmentioning

confidence: 75%