Analysis of Mechanism of Improvement in Highly Accelerated Lifetime via Measurement of Vanadium Valence in Multilayer Ceramic Capacitors

The mechanism of lifetime improvement through vanadium addition to multilayer ceramic capacitor with nickel electrode

“…That is to say, the conduction mechanism changed with vanadium addition, as the previous paper addressed. 9) To understand the detailed conduction mechanisms, IS analysis and SBH measurements were performed. Figure 3 shows Nyquist plots measured at 350°C under 1 Vdc.…”

“…Shibahara et al studied the valence state of vanadium doped into the dielectrics of Ni-MLCCs, and found that valence states other than +4 (i.e., the vanadium acts as acceptor or donor) are the main factors responsible for the improvement of reliability and decreased resistance. 9) They also found that the main cause of degradation during the highly accelerated life test (HALT) is the decrease in the interface resistance between the dielectric and nickel electrode, and the reliability improvement was caused by the slow degradation rate of interface resistance with vanadium addition. Natsui et al investigated vanadium distribution by scanning transmission electron microscopyelectron energy loss spectroscopy analysis.…”

Modified lifetime prediction for multilayer ceramic capacitors based on space charge evolution

“…[7][8][9][10][11] To implement this in MLCCs, the microstructure and composition of the dielectric material should be designed from this perspective. [12][13][14][15] Almost all investigations related to the MLCC lifetime employ a highly accelerated lifetime test (HALT) to evaluate the lifetime in a practical time period. In the HALT, the typical ambient temperature is above 125 °C, and the applied dc voltage is typically 2-5 times higher than the rated voltage of the MLCC.…”

X-ray absorption fine structure analysis of molybdenum added to BaTiO3-based ceramics used for multilayer ceramic capacitors

“…As a result, the reliability of MLCCs is largely affected by the concentration of residual oxide ionic vacancies in BTO. Many researchers have added rare earth, alkaline earth, and transition metal elements to BTO in order to achieve a certain high reliability of MLCCs and to meet standard specifications with regard to operating temperatures, [14][15][16][17][18][19][20][21][22][23][24][25][26] such as the X7R characteristic mentioned in the Electronic Industries Alliance standard. In particular, it was observed that control of the concentration of oxide ionic vacancies as well as that of their migration is important for ensuring good reliability of MLCCs.…”