2008
DOI: 10.1016/j.ijrmhm.2007.03.004
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Analysis of local composition gradients in the hard-phase grains of cermets using a combination of X-ray diffraction and electron microscopy

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Cited by 10 publications
(3 citation statements)
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“…The shape of the reflections of homogenized samples is of Cauchy type, which turns into a "super Gaussian" type for the segregated sample. The "super Gaussian" line broadening in the segregated state can be interpreted as a convolution of the diffraction lines produced by the homogenized sample with a function describing the distribution of interplanar spacings or local concentrations of individual elements [21]. Multi-component solid solutions with significantly different metallic radii of the constituting elements are expected to cause lattice strains that are reflected by an intense diffuse scattering.…”
Section: Resultsmentioning
confidence: 99%
“…The shape of the reflections of homogenized samples is of Cauchy type, which turns into a "super Gaussian" type for the segregated sample. The "super Gaussian" line broadening in the segregated state can be interpreted as a convolution of the diffraction lines produced by the homogenized sample with a function describing the distribution of interplanar spacings or local concentrations of individual elements [21]. Multi-component solid solutions with significantly different metallic radii of the constituting elements are expected to cause lattice strains that are reflected by an intense diffuse scattering.…”
Section: Resultsmentioning
confidence: 99%
“…The partial splitting of the XRD lines observed in h-BN samples with corrugated basal lattice planes can be reasonably described by a ‘ U ’-shaped physical broadening with two distinct maxima located below and above the respective theoretical line position and a valley between them. Such a function was employed by Rafaja et al (2008b) to describe the physical line broadening in materials containing concentration profiles formed in an interdiffusion process. The corresponding lattice corrugations can be described by a sigmoidal function of the volume amount y : where Δ c max is the maximum amplitude of the basal plane corrugations.…”
Section: Analysis Of Microstructure Defectsmentioning
confidence: 99%
“…The sigmoidal function from Eq. (8) is similar to the sum of the error functions, which was used by Rafaja et al (2008b) to describe the distribution of the lattice parameters in an interdiffusion process. However, the sigmoidal function can be refined more easily than the sum of the error functions.…”
Section: A X-ray Diffraction Analysis Of Basal Plane Corrugations Inmentioning
confidence: 99%