2014
DOI: 10.1016/j.cplett.2014.07.022
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Analysis of hole transport in thin films and nanoparticle assemblies of poly(3-hexylthiophene)

Abstract: We report numerical simulation results on hole transport in layers of the organic polymer poly(3-hexylthiophene) (P3HT) of different nanostructures based on a deterministic, phenomenological drift-diffusion-reaction model that accounts for hole trapping-detrapping kinetics. The model is used to characterize the various P3HT layers examined in terms of their hole transport dispersivity. The model reproduces well experimental data of photocurrent evolution in P3HT samples ranging from drop cast thin films to sur… Show more

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Cited by 11 publications
(18 citation statements)
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References 22 publications
(24 reference statements)
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“…We tried increased surfactant concentration to minimize aggregation, but found that excess surfactants can lead to dispersive charge transport, and did not consider it a viable solution. 19,20 We reasoned that the large aggregates of nanoparticles and crack formation in thin lms are due to de-wetting of the polymer nanoparticle dispersion, consistent with the observations of Krebs and co-workers. 9 Therefore, to increase surface wettability, we exposed the PEDOT:PSS layer to UV-O 3 for few minutes.…”
Section: Resultssupporting
confidence: 85%
“…We tried increased surfactant concentration to minimize aggregation, but found that excess surfactants can lead to dispersive charge transport, and did not consider it a viable solution. 19,20 We reasoned that the large aggregates of nanoparticles and crack formation in thin lms are due to de-wetting of the polymer nanoparticle dispersion, consistent with the observations of Krebs and co-workers. 9 Therefore, to increase surface wettability, we exposed the PEDOT:PSS layer to UV-O 3 for few minutes.…”
Section: Resultssupporting
confidence: 85%
“…A high surfactant concentration hindered the close packing of the NPs and increased the dispersive character of the hole transport in NP films. This behavior was further observed and explained by Han et al, 88 who analyzed their TOF measurements in the frame of a conventional set of diffusion and drift equations. The authors showed that the presence of surfactants in P3HT NP films increased the trap concentration as well as the trapping rate for charge carriers (in agreement with the observed dispersive hole transport).…”
Section: Vertical Composition Through the Active Layersupporting
confidence: 53%
“…However, the presence of the sulfate group and its sodium counterion can act as charge traps and decrease the charge mobility in films . Furthermore, even when a nonionic surfactant is used, as in the case of Pluronic F127, the presence of residual free surfactant molecules in the dispersion inhibits charge transport between the donor and acceptor in the film, as reported by Xie et al The presence of surfactant in the active layer was also reported to generate more defects, resulting in higher charge trapping, according to a numerical simulation performed by Han et al Therefore, the removal of the excess surfactant was reported by many teams through washing steps, dialysis, or centrifugal dialysis. ,, Postdeposition thermal treatment was also investigated as a surfactant removal technique by Cho et al , where annealing at 270 °C was performed on poly­[2,5-bis­(3-tetradecylthiophen-2-yl)­thieno­[3,2- b ]­thiophene] (PBTTT) nanoparticles (PBTTT showing a high T g ) stabilized by SDS in order to degrade efficiently the excess of surfactant …”
Section: Incorporation In Solar Cellsmentioning
confidence: 89%