Analysis of Distinct Degradation Behavior in LTPS TFTs Under Hot Carrier Condition with Varying Gate Voltage

Tu, Hong-Yi; Chang, Ting–Chang; Tsai, Tsung–Ming; Sun, Li–Chan; Kuo, Chen–Wei; Wu, Chia–Chuan; Chien, Ya–Ting

doi:10.1109/ipfa61654.2024.10691163

2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2024

DOI: 10.1109/ipfa61654.2024.10691163

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Analysis of Distinct Degradation Behavior in LTPS TFTs Under Hot Carrier Condition with Varying Gate Voltage

Hong-Yi Tu,

Ting–Chang Chang,

Tsung–Ming Tsai

et al.

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Analysis of Distinct Degradation Behavior in LTPS TFTs Under Hot Carrier Condition with Varying Gate Voltage

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References 36 publications

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