1999
DOI: 10.1063/1.123469
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Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods

Abstract: Articles you may be interested inDeep levels in as-grown and electron-irradiated n-type GaN studied by deep level transient spectroscopy and minority carrier transient spectroscopy

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Cited by 44 publications
(17 citation statements)
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“…However, in this case of a low density of deep traps, capacitance methods, such as DLTS, are more adequate. 20,21 It is interesting to note that to measure the intrinsic mobility 0 of the material the measurement should be done faster than the trapping time to ensure measuring the initial current. This, however, requires ultra-fast-pulsing techniques.…”
Section: ͑13͒mentioning
confidence: 99%
“…However, in this case of a low density of deep traps, capacitance methods, such as DLTS, are more adequate. 20,21 It is interesting to note that to measure the intrinsic mobility 0 of the material the measurement should be done faster than the trapping time to ensure measuring the initial current. This, however, requires ultra-fast-pulsing techniques.…”
Section: ͑13͒mentioning
confidence: 99%
“…2͒ and as active materials in lasers, 3 which may also find applications in electrically pumped laser diodes ͑LDs͒. Electronic defects such as traps strongly influence, or even dominate, both the optical and charge transport properties of organic 4 and inorganic devices. 5 Charges trapped at these defects are missing as mobile carriers, 6 change the space charge of the defect-rich region, can quench the emissive singlet excitons ͑SEs͒, 7 and can reabsorb the emission.…”
mentioning
confidence: 99%
“…The origin of DTHs has been the subject of some speculation with both intrinsic and extrinsic factors being evoked as the source of such trapping. Extrinsic factors include contamination by ion migration from other layers, residual impurities from the synthesis, and diffusion of O 2 and H 2 O into the device (10)(11)(12)(16)(17)(18)(19)(20)(21)(22)(23). Intrinsic charge trapping theories include mid-gap-state filling, bipolaron formation, interfacial surface sites within the device, and molecular rearrangement (2-4, 6, 8, 13, 14, 24-29).…”
mentioning
confidence: 99%