Analysis of Bulk and Surface Radiation Damage in n+ in p SFz Si Micro Strip Detectors for the Future High Luminosity Collider Experiments: TCAD Simulation and Measurements
Abstract:Within the framework of CERN RD50 collaboration, several radiation damage models for n/p-SFz, n-MCz Si have been explored for the better understanding of the experimental results in radiation damage analysis of the irradiated Si detectors. In the present paper, the important review on the microscopic radiation damage model for the p-type SFz Si detector combining the surface and radiation damage effects that can be used to simulate radiation damages effects in the heavily irradiated detectors for the good comp… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.