Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry

Wanwu, 郭万武 Guo; Liping, 张丽平 Zhang; Jian, 包健 Bao; Fanying, 孟凡英 Meng; Yifeng, 陈奕峰 Chen; Zhiqiang, 冯志强 Feng; Zhengxin, 刘正新 Liu

doi:10.3788/aos201535.0631002

光学学报

2015

DOI: 10.3788/aos201535.0631002

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Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry

郭万武 Guo Wanwu¹,

张丽平 Zhang Liping²,

包健 Bao Jian³

et al.

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Analysis of Amorphous Silicon Passivation Layer in Heterojunction Solar Cells by Spectroscopic Ellipsometry

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