Analysis for dynamic metrology

Abstract

Diverse measurement contexts require estimates of time-varying quantities. Ideally the measurement device responds to signal variations more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used for the calibration and analysis of the measurement system. By contrast, as the characteristic timescales for signal modulation and measurement response become commensurate, the situation becomes more complicated; directly measured quantities may require correction for the finite bandwidth of the measurement system response. Toward this goal heuristic estimation rules have evolved over time and are now widely used. We rederive these common rules of thumb, and present sufficient conditions for their validity. Furthermore, we investigate their quantitative performance in cases for which these conditions are violated and encounter surprisingly poor results. As an alternative, we demonstrate that regularized deconvolution analysis exhibits more general quantitative utility at the expense of increased measurement burden and analytical complexity.

Evaluation of dynamic measurement uncertainty – an open-source software package to bridge theory and practice

“…For instance, on-line evaluation of uncertainty in the application of finite impulse response (FIR) filters is addressed by (Elster and Link, 2008), and infinite impulse response (IIR) filters by (Link and Elster, 2009); efficient Monte Carlo methods for uncertainty propagation is presented in , the efficient reporting of high-dimensional covariance matrices is addressed by (Humphreys et al, 2015), regularized deconvolution in the frequency domain is considered by (Hale et al, 2009) and (Dienstfrey and Hale, 2014), and propagation of uncertainty in the application of the discrete Fourier transform (DFT) is addressed by . Moreover, the European Metrology Research Programme (EMRP) projects IND09, "Traceable dynamic measurement of mechanical quantities 1 ", (2011-2014) and IND16, "Metrology for ultra-fast electronics and high-speed communications 2 ", (2011-2014) laid the foundations for primary dynamic calibration of force, torque and pressure sensors, as well as bridge amplifiers and ultra-fast electronic devices.…”

GUM2DFT—a software tool for uncertainty evaluation of transient signals in the frequency domain

“…In particular for dynamic metrology, where the involved quantities have time varying values, the DFT is considered an essential tool. In dynamic metrology the DFT is employed, for instance, to assess the frequency content of a measured time series, design suitable digital filters or carry out input estimation, see [1][2][3][4][5][6] and references therein.…”

2015 Fellows Elevation and Recognition

“…In 1989, he joined the Optoelectronics Division of the National Institute of Standards and Technology (NIST), Boulder, Colorado, where he remained until 2014, conducting research on broadband device and signal metrology using ultrafast optoelectronic techniques [2] and sampling oscilloscopes [3], [4]. These techniques were applied to characterizing various high-speed devices [5]- [7] and launched significant results in waveform metrology [8]- [11]. During this time, he was a member of a multidisciplinary team that developed multivariate statistical tools to simultaneously quantify both the time and frequency domain uncertainties in measurements such as pulsed waveforms [10], [11] and the frequency response of photodiodes [12].…”