Analysis and Suppression for Gate Oscillation Caused by Body Diodes on Paralleled SiC MOSFETs Application

Zheng, Fujun.; Xu, He.; Gao, Hongyi.; Mei, Ying.; Zhu, Nan.; Xiang, Li.; Luo, Haoze.; Li, Wuhua.

doi:10.1109/ipemc-ecceasia60879.2024.10567188

2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) 2024

DOI: 10.1109/ipemc-ecceasia60879.2024.10567188

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Analysis and Suppression for Gate Oscillation Caused by Body Diodes on Paralleled SiC MOSFETs Application

Fujun. Zheng,

He. Xu,

Hongyi. Gao

et al.

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Analysis and Suppression for Gate Oscillation Caused by Body Diodes on Paralleled SiC MOSFETs Application

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