2014 IEEE International Wireless Symposium (IWS 2014) 2014
DOI: 10.1109/ieee-iws.2014.6864231
|View full text |Cite
|
Sign up to set email alerts
|

Analysis and modeling of CMOS millimeter-wave M:N six-port transformers

Abstract: This paper presents an modeling of on-chip M:N transformer with six-port and develops a series branch parameters extraction methodology for the proposed transformer model. These model and parameters extraction methodology are verified by measurements and full-wave electromagnetic simulation. Compared with the measurement, the proposed transformer model can accurately predict the performance of transformer from DC to the self-resonance frequency.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2015
2015
2017
2017

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(3 citation statements)
references
References 9 publications
0
3
0
Order By: Relevance
“…In order to describe the distributed effects of the lossy silicon substrate accurately, the conventional classic silicon substrate equivalent network, which contains three elements, oxide-substrate capacitance , substrate ohmic loss , and substrate parasitic capacitance , is applied [20], [21]. The oxide-substrate capacitance expresses the electrical coupling from windings to the top of the substrate, whereas substrate loss and parasitic capacitances represent the loss characteristics and electrical coupling of the silicon substrate.…”
Section: Equivalent-circuit Modelmentioning
confidence: 99%
See 2 more Smart Citations
“…In order to describe the distributed effects of the lossy silicon substrate accurately, the conventional classic silicon substrate equivalent network, which contains three elements, oxide-substrate capacitance , substrate ohmic loss , and substrate parasitic capacitance , is applied [20], [21]. The oxide-substrate capacitance expresses the electrical coupling from windings to the top of the substrate, whereas substrate loss and parasitic capacitances represent the loss characteristics and electrical coupling of the silicon substrate.…”
Section: Equivalent-circuit Modelmentioning
confidence: 99%
“…Their extraction methods are discussed in Section III-C. The voltage and impedance of every series branch can then be expressed as (20) …”
Section: B Series Branch Parameters Extractionmentioning
confidence: 99%
See 1 more Smart Citation