Analog Circuit Incipient Fault Detection Based on Attention Mechanism and Fully Convolutional Network
Yufeng Miao,
Ying Zhang,
Fuyang Chen
et al.
Abstract:Owing to the tolerance of circuit components in analogue circuits, feature overlap occurs between different component faults, especially in the case of early-stage faults. To address this issue, we present an improved model that utilizes the channel attention mechanism in conjunction with a fully convolutional network. The proposed model conducts end-to-end diagnosis by utilizing the response signals generated from the tested circuit. To diagnose different fault categories, we add a global average pooling laye… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.